INTERNATIONAL PATENT: ALPHANOV FILES APPLICATION FOR "X-RAY IMAGING DEVICE AND METHOD USING AT LEAST PHASE-CONTRAST IMAGING"

GENEVA, Oct. 4 -- ALPHANOV (Rue Francois Mitterrand33400 TALENCE) filed a patent application (PCT/EP2025/058018) for "X-RAY IMAGING DEVICE AND METHOD USING AT LEAST PHASE-CONTRAST IMAGING" on Mar 24, 2025. With publication no. WO/2025/202142, the details related to the patent application was published on Oct 02, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BAKKALI, Aboubakr (60B avenue Fernand Granet33140 VILLENAVE D'ORNON), MASTROPIETRO, Francesca (2023 route de la grande Segue40410 MANO), BARBREL, Benjamin (13 rue du Marechal Fayolle33130 BEGLES)

Abstract: The invention relates to an X...