INTERNATIONAL PATENT: ALLTEC ANGEWANDTE LASERLICHT TECHNOLOGIE GMBH FILES APPLICATION FOR "METHOD AND APPARATUS FOR PREDICTING PRINT QUALITY"

GENEVA, July 1 -- ALLTEC ANGEWANDTE LASERLICHT TECHNOLOGIE GMBH (An der Trave 27-3123923 Selmsdorf) filed a patent application (PCT/EP2024/087313) for "METHOD AND APPARATUS FOR PREDICTING PRINT QUALITY" on Dec 18, 2024. With publication no. WO/2025/132725, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JEHLE, Markus (c/o Alltec Angewandte Laserlicht Technologie GmbHAn der Trave 27-3123923 Selmsdorf), BEUTEL, Laura (c/o Alltec Angewandte Laserlicht Technologie GmbHAn der Trave 27-3123923 Selmsdorf), RANFT, Elmar (c/o Allt...