GENEVA, Feb. 17 -- AGC INC. (5-1, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008405), ＡＧＣ株式会社 (東京都千代田区丸の内一丁目５番１号) filed a patent application (PCT/JP2024/025485) for "METHOD FOR CALIBRATING OPTICAL INSPECTION DEVICE, AND METHOD FOR MANUFACTURING REFLECTION-TYPE MASK BLANK" on Jul 16, 2024. With publication no. WO/2025/033114, the details related to the patent application was published on Feb 13, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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