GENEVA, July 29 -- AETERLINK CORP. (2-5-2, Marunouchi, Chiyoda-ku, Tokyo1000005), エイターリンク株式会社 (東京都千代田区丸の内二丁目５番２号) filed a patent application (PCT/JP2024/045607) for "PROGRAM, MEASURING INSTRUMENT, SYSTEM, AND METHOD" on Dec 24, 2024. With publication no. WO/2025/154500, the details related to the patent application was published on Jul 24, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): KODATE Naoto...