INTERNATIONAL PATENT: AEHR TEST SYSTEMS FILES APPLICATION FOR "ELECTRONICS TESTER"

GENEVA, Aug. 19 -- AEHR TEST SYSTEMS (400 Kato TerraceFremont, California 94539) filed a patent application (PCT/US2025/014825) for "ELECTRONICS TESTER" on Feb 06, 2025. With publication no. WO/2025/171153, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SPORCK, Alistair N. (14970 Sobey Rd.Saratoga, California 95070), BREINLINGER, Richard H. (9277 Oak Trail CirSanta Rosa, California 95409), TONN, Timothy R. (714 Gunters Mountain LaneWylie, Texas 75098), CALDERON, Alberto (P.O. Box 720853San Jose, California 95172), RICHMO...