INTERNATIONAL PATENT: AC ANALYTICAL CONTROLS B.V. FILES APPLICATION FOR "DETECTING TRACE LEVELS OF A GAS COMPONENT IN A GAS SAMPLE"

GENEVA, Feb. 16 -- AC ANALYTICAL CONTROLS B.V. (Kiotoweg 5553047 BG Rotterdam) filed a patent application (PCT/EP2024/071823) for "DETECTING TRACE LEVELS OF A GAS COMPONENT IN A GAS SAMPLE" on Aug 01, 2024. With publication no. WO/2025/031930, the details related to the patent application was published on Feb 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BARENDREGT, Erwin (Van der Fuyckstraat 1523232 AS Brielle), VAN BREUGEL, Karsten (Jacobusstraat 223012 JN Rotterdam)

Abstract: The invention is directed to a method for detecting trace levels of an active gas component as contained ...