INTERNATIONAL PATENT: ABB SCHWEIZ AG FILES APPLICATION FOR "METHOD AND SYSTEM FOR DETECTING ANOMALIES IN PROCESS DATA OF INDUSTRIAL SYSTEMS"

GENEVA, Nov. 10 -- ABB SCHWEIZ AG (Bruggerstrasse 66 5400 Baden5400 Switzerland) filed a patent application (PCT/IB2025/054059) for "METHOD AND SYSTEM FOR DETECTING ANOMALIES IN PROCESS DATA OF INDUSTRIAL SYSTEMS" on Apr 17, 2025. With publication no. WO/2025/229449, the details related to the patent application was published on Nov 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): K R, Chandrika (1476, 18th Cross,, Kumaraswamy Layout 1st Stage,Bangalore, Karnataka 560078), SHARMA, Divyasheel (L-404, Brigade Metropolis,, Whitefield Main Road, Mahadevapura Post,Bangalore, Karnataka 560048),...