Beijing, July 25 -- Chinese scientists have unveiled the world's first genetic map tracking wheat resistance to the devastating yellow rust disease, representing a significant breakthrough that promises more durable wheat resistance and decreased pesticide dependency.
Their research, which was published in the Nature Genetics journal on July 23, was jointly led by the Northwest Agriculture and Forestry University (NWAFU) and the Chinese Academy of Sciences' Institute of Genetics and Developmental Biology.
It provides breeders with an unprecedented gene navigation tool, the university told Xinhua today.
Yellow rust, which is caused by the Puccinia striiformis f. sp. tritici (Pst) pathogen, is often termed "wheat cancer." It mutat...