ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,522,293, issued on Jan. 13, was assigned to KOMATSU LTD. (Tokyo). "Crawler-type work machine" was invented by Takeshi Yoshikawa (Tokyo), Hiroak... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,172, issued on Jan. 13, was assigned to QUALCOMM Inc. (San Diego). "Voltage mode driver for high-performance and low-power co-existence" wa... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,170, issued on Jan. 13, was assigned to MITSUBISHI HEAVY INDUSTRIES ENGINE & TURBOCHARGER. LTD. (Sagamihara, Japan). "Internal combustion e... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,831, issued on Jan. 13, was assigned to NVIDIA Corp. (Santa Clara, Calif.). "Machine learning techniques for enhancing video conferencing a... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,190, issued on Jan. 13, was assigned to RAKUTEN SYMPHONY INC. (Tokyo). "Automated power on notification system and method thereof" was inve... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,305, issued on Jan. 13, was assigned to PURE STORAGE INC. (Santa Clara, Calif.). "Dynamic power loss protection allocation of managed flash... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,581, issued on Jan. 13, was assigned to HORIBA LTD. (Kyoto, Japan). "Diluter, analysis system, and analysis method" was invented by Shota S... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,522,143, issued on Jan. 13, was assigned to SUMITOMO HEAVY INDUSTRIES LTD. (Tokyo). "Surround view monitor system, and work machine" was invent... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,445, issued on Jan. 13, was assigned to Centre Firearms Co. Inc. (Ridgewood, N.Y.). "Reflective sight for a firearm" was invented by Juan D... Read More
ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,526,541, issued on Jan. 13, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Method and apparatus with high-resolution im... Read More