Japan, Jan. 27 -- GLOBALWAFERS JAPAN CO LTD has got intellectual property rights for 'SEMICONDUCTOR WAFER IMPURITY MEASUREMENT METHOD AND IMPURITY MEASUREMENT JIG.' Other related details are as follows:

Application Number: JP,2022-102409

Category (FI): G01N1/28@X,G01N27/62@F,G01N1/28@W,G01N1/28@T,G01N1/32@B,G01N27/62@V

Stage: Grant (IP right granted following substantive examination.)

Filing Date: June 27, 2022

Publication Date: Jan. 15, 2024

The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100

Disclaimer: Curated by HT Syndication....