Japan, Jan. 21 -- QUALTEC:KK has got intellectual property rights for 'SEMICONDUCTOR ELEMENT TESTING DEVICE AND TESTING METHOD FOR SEMICONDUCTOR ELEMENT.' Other related details are as follows:
Application Number: JP,2021-153708
Category (FI): G01R31/26@B,G01R31/26@A,H02M1/00@B
Stage: Grant (IP right document published.)
Filing Date: Sept. 22, 2021
Publication Date: April 5, 2022
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....