Japan, Jan. 27 -- TEKTRONIX INC has got intellectual property rights for 'RECOGNITION METHOD OF DEVICE UNDER TEST AND TEST MEASUREMENT SYSTEM.' Other related details are as follows:
Application Number: JP,2021-047679
Category (FI): G01R31/319,G01R31/28@X,G06F18/22
Stage: Grant (IP right granted following substantive examination.)
Filing Date: March 22, 2021
Publication Date: Sept. 27, 2021
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....