Japan, Jan. 28 -- UNIV OF TOKYO has got intellectual property rights for 'FINE PARTICLE MEASURING DEVICE AND FINE PARTICLE MEASURING METHOD.' Other related details are as follows:
Application Number: JP,2021-126164
Category (FI): G01N21/47@A,G01N15/14@K,G01N15/00@A,G01N15/1434,100,G01N15/1434,G01N15/1429,200,G01N15/1429,G01N15/14@P,G01N15/02@A,G01N37/00,101,G01N15/0205,G01N21/53@Z
Stage: Grant (IP right document published.)
Filing Date: July 30, 2021
Publication Date: Feb. 9, 2023
The original document can be viewed at: https://www.j-platpat.inpit.go.jp/p0100
Disclaimer: Curated by HT Syndication....