MUMBAI, India, Nov. 14 -- Intellectual Property India has published a patent application (202547096901 A) filed by Koninklijke Philips N. V., Eindhoven, Netherlands, on Oct. 8, for 'x-ray system with modular two-layer detector.'
Inventor(s) include Johnson, Mark Thomas; Vogtmeier, Gereon; Koehler, Thomas; Chaudhury, Sudipta; and Chakrabarti, Biswaroop.
The application for the patent was published on Nov. 14, under issue no. 46/2025.
According to the abstract released by the Intellectual Property India: "The present invention relates to a detection system for an X-ray imaging system. The detection system comprises a first detector a second detector, each detector comprising a detector area and being configured for detecting X-ray radiatio...