Intellectual Property India Publishes Patent Application for 'X-Ray Diffraction Apparatus And Method For Analysing Packaged Samples' Filed by Malvern Panalytical B. V.

MUMBAI, India, Nov. 7 -- Intellectual Property India has published a patent application (202547095901 A) filed by Malvern Panalytical B. V., Almelo, Netherlands, on Oct. 6, for 'x-ray diffraction apparatus and method for analysing packaged samples.'

Inventor(s) include Kogan, Vladimir; and Beckers, Detlef.

The application for the patent was published on Nov. 7, under issue no. 45/2025.

According to the abstract released by the Intellectual Property India: "The present invention relates to a method and an X-ray diffraction apparatus for angular dispersive X-ray diffraction analysis of an analyte (sample) confined in a packaging (a "packaged sample"). The method comprises arranging a first primary X-ray optic between an X-ray source and th...