MUMBAI, India, Jan. 31 -- Intellectual Property India has published a patent application (202417057467 A) filed by Tmeic Corporation, Tokyo, on July 29, 2024, for 'vehicle test device and operation control method for vehicle test device.'
Inventor(s) include Urata Yohei; Kuwahara Atsushi; Ohtsuka Junji; Kotoo Kohsuke; and Suwa Yuta.
The application for the patent was published on Jan. 31, under issue no. 05/2025.
According to the abstract released by the Intellectual Property India: "The purpose of the present disclosure is to provide a vehicle test device, such as a chassis dynamometer, which eliminates the need for advance preparation concerning the tire turning angle and enables an accurate angular displacement amount recognition. Dis...