Intellectual Property India Publishes Patent Application for 'Validity Duration Of A Carrier Phase Measurement' Filed by Nokia Technologies Oy

MUMBAI, India, Nov. 7 -- Intellectual Property India has published a patent application (202547096508 A) filed by Nokia Technologies Oy, Espoo, Finland, on Oct. 7, for 'validity duration of a carrier phase measurement.'

Inventor(s) include Keating, Ryan; Cha, Hyun-Su; and Joshi, Satya Krishna.

The application for the patent was published on Nov. 7, under issue no. 45/2025.

According to the abstract released by the Intellectual Property India: "A method, apparatus, and computer program product determine, provide, and/or utilize a validity duration of a carrier phase (CP) measurement. The validity duration of a carrier phase measurement enables reuse of certain carrier phase measurements used in a double differential carrier phase (DD-CP) ...