MUMBAI, India, Aug. 8 -- Intellectual Property India has published a patent application (202414041123 A) filed by Henan Fuchi Technology Co. Ltd.; Hongfujin Precision Electronics (ZHENGZHOU) Co. Ltd.; Fu Tai Hua Industry (SHENZHEN) Co. Ltd.; Taiyuan Fuchi Technology Co. Ltd.; and Hon Hai Precision Industry Co. Ltd., Zhengzhou, China, on May 27, 2024, for 'testing device.'
Inventor(s) include Jinqiang Wang; Feng Lei; Fang Wang; Wutao Li; Qianghe Chang; and Gaochao Li.
The application for the patent was published on Aug. 8, under issue no. 32/2025.
According to the abstract released by the Intellectual Property India: "A testing device (100) includes a bearing bracket (10); a track mechanism (20) arranged on the bearing bracket (10), inclu...