Intellectual Property India Publishes Patent Application for 'Test Specimen Testing System, Test Specimen Testing Method, And Test Specimen Testing Program' Filed by Horiba, Ltd.

MUMBAI, India, May 30 -- Intellectual Property India has published a patent application (202517028544 A) filed by Horiba, Ltd., Kyoto, Japan, on March 26, for 'test specimen testing system, test specimen testing method, and test specimen testing program.'

Inventor(s) include Komatsu, Yoji; Yoshinaka, Yuji; and Koyama, Satoshi.

The application for the patent was published on May 30, under issue no. 22/2025.

According to the abstract released by the Intellectual Property India: "The objective of the present invention is to reduce the number of man-hours required for testing a vehicle that includes an automated driving system or an advanced driving assistance system, and to enable a development period for the same to be reduced, and to this...