Intellectual Property India Publishes Patent Application for 'System For Agricultural Yield Forecasting And Quality Assessment' Filed by Lovely Professional University

MUMBAI, India, Dec. 13 -- Intellectual Property India has published a patent application (202511102291 A) filed by Lovely Professional University, Phagwara, Punjab, on Oct. 24, for 'system for agricultural yield forecasting and quality assessment.'

Inventor(s) include Dr. Sawinder Kaur Vermani; Dr. Ankur Bahl; Lavish Kansal; and Gaurav Gupta.

The application for the patent was published on Dec. 12, under issue no. 50/2025.

According to the abstract released by the Intellectual Property India: "A system for agricultural yield forecasting and quality assessment comprising, a data acquisition module 101 configured to collect meteorological parameters and crop image data, a preprocessing module 102 configured to clean and normalize input dat...