Intellectual Property India Publishes Patent Application for 'Surface Defect Detecting Method And Surface Defect Detecting Device' Filed by Jfe Steel Corporation

MUMBAI, India, March 28 -- Intellectual Property India has published a patent application (202517022319 A) filed by Jfe Steel Corporation, Tokyo, on March 12, for 'surface defect detecting method and surface defect detecting device.'

Inventor(s) include Umegaki Yoshiyuki; and Ono Hiroaki.

The application for the patent was published on March 28, under issue no. 13/2025.

According to the abstract released by the Intellectual Property India: "This surface defect detecting method for optically detecting a surface defect of a strip-shaped body includes an image acquisition step for detecting reflected light from the strip-shaped body, obtained by illuminating a surface of the strip-shaped body, and imaging the surface of the strip-shaped bod...