Intellectual Property India Publishes Patent Application for 'Sample Test Method, Test Kit For Gynecological Cancer And Precancerous Lesion Thereof, And Medicine' Filed by Nihon University; and Keio University

MUMBAI, India, Feb. 28 -- Intellectual Property India has published a patent application (202517009750 A) filed by Nihon University; and Keio University, Tokyo, on Feb. 6, for 'sample test method, test kit for gynecological cancer and precancerous lesion thereof, and medicine.'

Inventor(s) include Katoh Yuki; Kawana Kei; and Kubo Akiko.

The application for the patent was published on Feb. 28, under issue no. 09/2025.

According to the abstract released by the Intellectual Property India: "Provided are: a simple and highly accurate sample test method which can be applied to the evaluation of the presence or absence of at least one selected from the group consisting of a gynecological cancer and a precancerous lesion thereof, the evaluation...