Intellectual Property India Publishes Patent Application for 'Resistance Measurement Device And Resistance Measurement Method' Filed by Hioki E. E. Corporation

MUMBAI, India, April 25 -- Intellectual Property India has published a patent application (202517032816 A) filed by Hioki E. E. Corporation, Nagano, Japan, on April 2, for 'resistance measurement device and resistance measurement method.'

Inventor(s) include Nagai, Hideyuki; Matsubayashi, Hideo; Nishizawa, Takafumi; and Kimoto, Motoaki.

The application for the patent was published on April 25, under issue no. 17/2025.

According to the abstract released by the Intellectual Property India: "This resistance measurement device comprises a connection structure unit including a set of first contact parts that make contact with a first member and a second member, and a set of second contact parts that make contact with different locations of th...