MUMBAI, India, Sept. 26 -- Intellectual Property India has published a patent application (202517084121 A) filed by Jfe Steel Corporation, Tokyo, on Sept. 4, for 'quality defect diagnostic device and quality defect diagnostic method.'
Inventor(s) include Takagi, Hiroyuki; and Hirata, Takehide.
The application for the patent was published on Sept. 26, under issue no. 39/2025.
According to the abstract released by the Intellectual Property India: "This quality defect diagnostic device diagnoses quality defects occurring in products, and is provided with: a data dividing unit that divides product data to be diagnosed, which consists of operation data and quality data, into prescribed separate blocks in a two-dimensional manner; a data aggre...