Intellectual Property India Publishes Patent Application for 'Microparticle Measurement System And Microparticle Measurement Method' Filed by Kabushiki Kaisha Toshiba; and Toshiba Infrastructure Systems & Solutions Corporation

MUMBAI, India, Jan. 31 -- Intellectual Property India has published a patent application (202414014471 A) filed by Kabushiki Kaisha Toshiba; and Toshiba Infrastructure Systems & Solutions Corporation, Tokyo, on Feb. 28, 2024, for 'microparticle measurement system and microparticle measurement method.'

Inventor(s) include Moriaki Torii; and Shuhei Noda.

The application for the patent was published on Jan. 31, under issue no. 05/2025.

According to the abstract released by the Intellectual Property India: "A microparticle measuring system includes a light source (11), an objective lens (16), an imaging lens (17), an image sensor (18), and an information processing unit (20). The light source (11) emits illumination light (L) to liquid (SP) ...