Intellectual Property India Publishes Patent Application for 'Methods And Systems For Detecting Functional Defects At Designing Stage Of A Design Code' Filed by Samsung Electronics Co. Ltd.

MUMBAI, India, Nov. 14 -- Intellectual Property India has published a patent application (202441037422 A) filed by Samsung Electronics Co. Ltd., Gyeonggi, Republic of Korea, on May 13, 2024, for 'methods and systems for detecting functional defects at designing stage of a design code.'

Inventor(s) include Maruthi Srinivas Narasimhan; and Satyam Saxena.

The application for the patent was published on Nov. 14, under issue no. 46/2025.

According to the abstract released by the Intellectual Property India: "A method for detecting one or more functional defects in a design code includes generating, using processing circuitry, Hardware Verification Language (HVL) code representing semantic behaviour of design code, the generating including ide...