MUMBAI, India, May 9 -- Intellectual Property India has published a patent application (202517038167 A) filed by Unilin, Bv, Wielsbeke, Belgium, on April 21, for 'method for inspecting panels, and device used for this.'
Inventor(s) include Vanhessche, Matti; Van Nevel, Stijn; and Naeyaert, Christophe.
The application for the patent was published on May 9, under issue no. 19/2025.
According to the abstract released by the Intellectual Property India: "Process for inspecting panels, wherein the above-mentioned panels (1) are provided with profiled edge areas with coupling parts (8), characterised in that the process comprises at least the step of recording at least a first and second part (20-21) of the contour of the cross-section of a fi...