MUMBAI, India, June 6 -- Intellectual Property India has published a patent application (202517017782 A) filed by Obshhestvo S Ogranichennoj Otvetstvennostyu Indikom, Saint-Petersburg, Russia, on Feb. 28, for 'method for determining the spatial profile of inspected objects.'
Inventor(s) include Grebenshchikov, Vladimir Vital'Evich; Vrubel', Ivan Igorevich; and Spirin, Denis Olegovich.
The application for the patent was published on June 6, under issue no. 23/2025.
According to the abstract released by the Intellectual Property India: "The operating principle of the method for determining the spatial profile of an inspected object via the backscatter inspection unit is based on registering the ionizing radiation scattered by the object of...