Intellectual Property India Publishes Patent Application for 'Method And System For Assessing Internal Defects Of A Material' Filed by Wipro Limited

MUMBAI, India, April 4 -- Intellectual Property India has published a patent application (202341065784 A) filed by Wipro Limited, Bangalore, Karnataka, on Sept. 29, 2023, for 'method and system for assessing internal defects of a material.'

Inventor(s) include Akilan Baskar; and Sujatha Jagannath.

The application for the patent was published on April 4, under issue no. 14/2025.

According to the abstract released by the Intellectual Property India: "Disclosed herein is a method and system for assessing one or more defects in a material. The method comprises extracting one or more assessment parameters from ultrasound waves propagated through a cross-section of the material. Further, the method identifies presence of one or more defects in...