MUMBAI, India, May 2 -- Intellectual Property India has published a patent application (202517024003 A) filed by Northrop Grumman Litef Gmbh, Freiburg, Germany, on March 18, for 'method and device for measuring a voltage.'
Inventor(s) include Konig, Stefan.
The application for the patent was published on May 2, under issue no. 18/2025.
According to the abstract released by the Intellectual Property India: "A method for measuring a voltage using a microelectromechanical system, MEMS, (100) comprising a sample mass (110) which is supported above a substrate by means of mechanical spring elements (120) in such a way that it can be moved relative to the substrate along a vibration direction (x), trimming electrodes (130) which are suitable f...