Intellectual Property India Publishes Patent Application for 'Measurement Collection And Reporting' Filed by Nokia Technologies Oy

MUMBAI, India, April 4 -- Intellectual Property India has published a patent application (202341065559 A) filed by Nokia Technologies Oy, Espoo, Finland, on Sept. 29, 2023, for 'measurement collection and reporting.'

Inventor(s) include Ethiraj Alwar; and Anna Pantelidou.

The application for the patent was published on April 4, under issue no. 14/2025.

According to the abstract released by the Intellectual Property India: "Embodiments of the present disclosure relate to apparatuses, methods, and computer readable storage media for data collection. A first apparatus prepares a measurement collection configuration comprising a list for Minimization of Drive Test (MDT) measurement collection and a measurement granularity. The list comprises...