MUMBAI, India, March 7 -- Intellectual Property India has published a patent application (202517013993 A) filed by Kabushiki Kaisha Toshiba; and Toshiba Infrastructure Systems & Solutions Corporation, Tokyo, on Feb. 18, for 'inspection device and inspection method.'
Inventor(s) include Ono, Tomio; Nakai, Yutaka; and Yamamoto, Noriko.
The application for the patent was published on March 7, under issue no. 10/2025.
According to the abstract released by the Intellectual Property India: "Provided are an inspection device and an inspection method with which detection accuracy can be improved. According to an embodiment, the inspection device comprises first and second transmission units, first and second reception units, a transporting unit,...