Intellectual Property India Publishes Patent Application for 'In-Situ 3-Axis Defect Growth Scanner For Cfrp Composites Subject To Testing Under Static And Cyclic Loading' Filed by Illinois Tool Works, Inc.

MUMBAI, India, Sept. 5 -- Intellectual Property India has published a patent application (201641022664 A) filed by Illinois Tool Works, Inc., Glenview, U.S.A., on July 1, 2016, for 'in-situ 3-axis defect growth scanner for cfrp composites subject to testing under static and cyclic loading.'

Inventor(s) include Pradeep. K; Chandru Haralakere Puttaswamy; Murali Mohan; Sunder Ramasubbu; and Somayya Ammanagi.

The application for the patent was published on Sept. 5, under issue no. 36/2025.

According to the abstract released by the Intellectual Property India: "The present invention relates to an integrated system and method for in-situ 3-axis scanning and detecting defects in a CFRP composite being loaded under static and cyclic test conditi...