MUMBAI, India, March 15 -- Intellectual Property India has published a patent application (202517016599 A) filed by Huawei Technologies Co. Ltd., Guangdong, China, on Feb. 25, for 'data quality measurement method and device.'
Inventor(s) include Liang, Jing; Chai, Xiaomeng; Wei, Hong; Sun, Yan; Zhou, Rui; Yang, Liusha; and Luo, Zhiquan.
The application for the patent was published on March 14, under issue no. 11/2025.
According to the abstract released by the Intellectual Property India: "A data quality measurement method and device. The method comprises: a data quality measurement device sends first configuration information to a first data collection node, wherein the first configuration information is used for configuring feature extr...