MUMBAI, India, Jan. 31 -- Intellectual Property India has published a patent application (202417102697 A) filed by Hunan Ramon Science & Technology Co. Ltd., Hunan, China, on Dec. 24, 2024, for 'bar sampling inspection platform.'
Inventor(s) include Tian, Lu; and Wang, Hanlin.
The application for the patent was published on Jan. 31, under issue no. 05/2025.
According to the abstract released by the Intellectual Property India: "A bar sampling inspection platform, comprising: a mounting table (1), wherein the mounting table (1) is configured to bear various inspection tools; a movable carrying device (2), which is configured to convey a device mounted at a tail end to a designated position; a pick-up and flame cutting device (3), which is...