MUMBAI, India, May 2 -- Intellectual Property India has published a patent application (202517034927 A) filed by Mettler Toledo (CHANGZHOU) Precision Instruments Ltd.; Mettler Toledo (CHANGZHOU) Measurement Technology Ltd; and Mettler Toledo Technologies (CHINA) Co. Ltd., Jiangsu, China, on April 9, for 'a method for level correction of a load cell in a weighing system.'
Inventor(s) include Wang Shenhui; Gu Jun; Yang Li; Wu Jianwei; Yang Jianqiang; Zhao Yupeng; Cai Jinjie; Guo Zheng; Li Chunhui; and Zhang Song.
The application for the patent was published on May 2, under issue no. 18/2025.
According to the abstract released by the Intellectual Property India: "A method for correcting the level of a load cell in a weighing system comprisi...