Intellectual Property India Publishes Patent Application for 'A Method And System For Determining Verticality Parameters Of Radar For Beam Pointing Alignment' Filed by Indian Institute Of Technology

MUMBAI, India, Jan. 23 -- Intellectual Property India has published a patent application (202511122668 A) filed by Indian Institute Of Technology, Jodhpur, Rajasthan, on Dec. 5, 2025, for 'a method and system for determining verticality parameters of radar for beam pointing alignment.'

Inventor(s) include Sudarsana Jena; and Ankur Gupta.

The application for the patent was published on Jan. 23, under issue no. 04/2026.

According to the abstract released by the Intellectual Property India: "A method and system for determining verticality parameters of radar for beam-pointing alignment is disclosed. The system employs an inertia measurement module mounted in fixed alignment with the radar antenna and acquires reference inclination data alon...