ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,213,240, issued on Jan. 28, was assigned to Hamilton Sundstrand Corp. (Charlotte, N.C.). "Pin-fin cooling for printed circuit boards (PCBs)" wa... Read More
ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,211,699, issued on Jan. 28, was assigned to UNITED MICROELECTRONICS CORP. (Hsin-Chu, Taiwan). "Method of removing step height on gate structure... Read More
ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,212,016, issued on Jan. 28, was assigned to NINGDE AMPEREX TECHNOLOGY Ltd. (Ningde, China). "Battery cell and electronic apparatus having such ... Read More
ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,210,352, issued on Jan. 28, was assigned to HYUNDAI MOTOR COMPANY (Seoul, South Korea) and KIA Corp. (Seoul, South Korea). "System and method f... Read More
ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,211,031, issued on Jan. 28, was assigned to Disney Enterprises Inc. (Burbank, Calif.). "Systems and methods to compilate an experience summary ... Read More
ALEXANDRIA, Va., Jan. 29 -- United States Patent no. D1,059,268, issued on Jan. 28, was assigned to JINKO ENERGY STORAGE TECHNOLOGY Co. LTD. (Haining, China) and SHANGHAI JINKO GREEN ENERGY ENTERPRISE... Read More
ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,208,811, issued on Jan. 28, was assigned to Geotab Inc. (Oakville, Canada). "Systems and methods for determining an estimated weight of a vehic... Read More
ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,208,930, issued on Jan. 28, was assigned to T-Mobile USA Inc. (Bellevue, Wash.). "5G-connected drone routing system capable of monitoring inter... Read More
ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,208,026, issued on Jan. 28, was assigned to University of Utah Research Foundation (Salt Lake City). "Prosthesis with powered ankle and toe joi... Read More
ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,211,200, issued on Jan. 28, was assigned to NANYA TECHNOLOGY Corp. (New Taipei, Taiwan). "Wafer inspection system method" was invented by Chia-... Read More