ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,545,205, issued on Feb. 10. "Driver protection system and methods of operating the same" was invented by Edward Martin Dougherty III (Perkasie,... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. D1,112,610, issued on Feb. 10, was assigned to Heineken UK Ltd. (Edinburgh, Great Britain). "Fluid distribution equipment" was invented by Stuart ... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,657, issued on Feb. 10, was assigned to NeoGenesys Inc. (Holly Ridge, N.C.). "Methods and systems for remote monitoring of electrical equip... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,545,158, issued on Feb. 10, was assigned to Intel Corp. (Santa Clara, Calif.). "Methods and devices for a vehicle" was invented by Ignacio J. A... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. D1,112,266, issued on Feb. 10, was assigned to Limin Zhang (Seattle). "Display screen or portion thereof with graphical user interface" was invent... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,756, issued on Feb. 10, was assigned to LABORATORI BALDACCI S.P.A. (Pisa, Italy). "Mixture of isomers of aminaphtone, analytical method for... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,550,503, issued on Feb. 10, was assigned to TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY Co. LTD. (Shenzhen, China). "Manufacturing method of disp... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,548,860, issued on Feb. 10, was assigned to SANYO Electric Co. Ltd. (Osaka, Japan). "Electrode plate for secondary cell, and secondary cell usi... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,870, issued on Feb. 10, was assigned to ams Sensors Belgium BVBA (Berchem, Belgium). "Imaging device, optoelectronic device and method for ... Read More
ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,550,686, issued on Feb. 10, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Wafer total thickness variation using maskless impla... Read More