ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,036, issued on May 20, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Optical devices and methods of manuf... Read More
ALEXANDRIA, Va., June 16 -- United States Patent no. 12,308,324, issued on May 20, was assigned to Winbond Electronics Corp. (Taichung, Taiwan). "Overlay mark" was invented by Kuang-Chung Lee (Taichu... Read More
ALEXANDRIA, Va., June 16 -- United States Patent no. 12,304,768, issued on May 20, was assigned to KYOCERA Document Solutions Inc. (Osaka, Japan). "Sheet conveyance device and image forming system" w... Read More
ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,631, issued on May 20, was assigned to WELTREND SEMICONDUCTOR INC. (Hsinchu, Taiwan). "Super-resolution image reconstruction method and sup... Read More
ALEXANDRIA, Va., June 16 -- United States Patent no. 12,303,934, issued on May 20, was assigned to RESONAC Corp. (Tokyo). "Method for manufacturing laminate" was invented by Masumi Morihara (Tagawa, ... Read More
ALEXANDRIA, Va., June 16 -- United States Patent no. 12,303,743, issued on May 20. "Real-time coaching system" was invented by Sang Joon Ahn (Seoul, South Korea) and Bong Soo Han (Seoul, South Korea)... Read More
ALEXANDRIA, Va., June 16 -- United States Patent no. D1,076,225, issued on May 20. "Handle for hot air comb" was invented by Guanping Liu (Hubei, China). The patent was filed on Dec. 17, 2024, under... Read More
ALEXANDRIA, Va., June 16 -- United States Patent no. 12,309,896, issued on May 20. "Lighting system and control method of said system" was invented by Andrea Tellatin (Mestrino, Italy). According to... Read More
ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,829, issued on May 20, was assigned to Databricks Inc. (San Francisco). "Execution and attestation of user defined functions in databases" ... Read More
ALEXANDRIA, Va., June 16 -- United States Patent no. 12,308,202, issued on May 20, was assigned to NuFlare Technology Inc. (Yokohama, Japan). "Multi-electron beam inspection apparatus, multipole arra... Read More