GENEVA, Dec. 8 -- BASF SE (Carl-Bosch-Strasse 3867056 Ludwigshafen am Rhein) filed a patent application (PCT/EP2025/063771) for "SUSTAINABLE EXPERIMENTAL DESIGN WITH AI" on May 20, 2025. With publicat... Read More
GENEVA, Dec. 8 -- MEDTRONIC IRELAND MANUFACTURING UNLIMITED COMPANY (10 Earlsfort TerraceDublin 2, D02 T380) filed a patent application (PCT/EP2025/064158) for "ABLATION SUCCESS QUANTIFICATION" on May... Read More
GENEVA, Dec. 8 -- GEBRUDER KLOCKER GMBH (HauptstraBe 6446325 Borken-Weseke) filed a patent application (PCT/EP2025/063579) for "LENO SELVEDGE DEVICE FOR FORMING A LENO SELVEDGE" on May 16, 2025. With ... Read More
GENEVA, Dec. 8 -- TETRA LAVAL HOLDINGS & FINANCE S.A. (70, Avenue General-GuisanCH-1009 PULLY) filed a patent application (PCT/EP2025/064172) for "FOLDING APPARATUS, PACKAGING MACHINE HAVING A FOLDING... Read More
GENEVA, Dec. 8 -- VALEO EMBRAYAGES (81 avenue Roger DUMOULIN80009 AMIENS) filed a patent application (PCT/EP2025/064009) for "TRANSMISSION SHAFT FOR A TRANSMISSION SYSTEM FOR AN ELECTRIC OR HYBRID VEH... Read More
GENEVA, Dec. 8 -- COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN (23 Place des Carmes-Dechaux63000 CLERMONT-FERRAND) filed a patent application (PCT/EP2025/064073) for "TYRE FOR A VEHICLE COMPRISING A... Read More
GENEVA, Dec. 8 -- AMAZONEN-WERKE H. DREYER SE & CO. KG (Am Amazonenwerk 9-1349205 Hasbergen) filed a patent application (PCT/EP2025/063958) for "DIRT TRAP, DIRT TRAP UNIT, AND TRACTOR-MOUNTED AGRICULT... Read More
GENEVA, Dec. 8 -- Q.ANT GMBH (HandwerkstraBe 2970565 Stuttgart) filed a patent application (PCT/EP2025/063568) for "METHOD AND APPARATUS FOR THE MULTIPLICATION OF MATRICES AND/OR THE MULTIPLICATION OF... Read More
GENEVA, Dec. 8 -- NOVADIP BIOSCIENCES (Rue Granbonpre 111435 Mont-Saint-Guibert) filed a patent application (PCT/EP2025/064052) for "A COMPOSITION COMPRISING EXTRACELLULAR VESICLES FOR USE IN THE TREA... Read More
GENEVA, Dec. 8 -- ROBERT BOSCH GMBH (Postfach 30 02 2070442 Stuttgart) filed a patent application (PCT/EP2025/063759) for "METHOD AND DEVICE FOR DETERMINING AN ERROR STATE IN A SEMICONDUCTOR MODULE" o... Read More