ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,425, issued on Feb. 3. "VCSEL array with different emitter structures" was invented by Dongseok Kang (Sunnyvale, Calif.), Siva Kumar Lanka (... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,539,326, issued on Feb. 3, was assigned to Novo Nordisk A/S (Bagsvaerd, Denmark). "Methods for treating Alzheimer's disease using semaglutide" w... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,300, issued on Feb. 3, was assigned to Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. (Munich). "Bioreactor and metho... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,182, issued on Feb. 3, was assigned to TYCO FIRE & SECURITY GMBH (Neuhausen am Rheinfall, Switzerland). "Building data platform with analyti... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,400, issued on Feb. 3, was assigned to HARTING Electric Stiftung & Co. KG (Espelkamp, Germany). "Connector assembly" was invented by Denny H... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,786, issued on Feb. 3, was assigned to Magpul Industries Corp. (Austin, Texas). "Modular AR-type safety selector with lever mounting pins" w... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,543,528, issued on Feb. 3, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Contamination control in semiconducto... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,270, issued on Feb. 3, was assigned to Saudi Arabian Oil Co. (Dhahran, Saudi Arabia). "Polymers and nanoparticles for flooding" was invented... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,543,470, issued on Feb. 3, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea). "Color conversion substrate including low refracti... Read More
ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,540,905, issued on Feb. 3, was assigned to EPIR INC. (Bolingbrook, Ill.). "System and method for optical mapping of semiconductor wafers at cryo... Read More