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INTERNATIONAL PATENT: FUJITSU GENERAL LIMITED, 株式会社富士通ゼネラル FILES APPLICATION FOR "REFRIGERANT LEAKAGE DETERMINING DEVICE, AIR CONDITIONER, REFRIGERANT LEAKAGE DETERMINATION PROGRAM AND REFRIGERANT LEAKAGE DETERMINATION METHOD"

GENEVA, Oct. 5 -- FUJITSU GENERAL LIMITED (3-3-17, Suenaga, Takatsu-ku, Kawasaki-shi, Kanagawa2138502), 株式会社富士通ゼネラル (&#3107... Read More


INTERNATIONAL PATENT: LINKWIZ INCORPORATED, リンクウィズ株式会社 FILES APPLICATION FOR "INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD AND WORK ROBOT SYSTEM"

GENEVA, Oct. 5 -- LINKWIZ INCORPORATED (1044-2, Sasagase-cho, Chuo-ku Hamamatsu-shi, Shizuoka4350042), リンクウィズ株式会社 (静&#23713... Read More


INTERNATIONAL PATENT: THE UNIVERSITY OF TOKYO, 国立大学法人東京大学 FILES APPLICATION FOR "ION TRAP DEVICE AND ION TRAP SYSTEM"

GENEVA, Oct. 5 -- THE UNIVERSITY OF TOKYO (3-1, Hongo 7-chome, Bunkyo-ku, Tokyo1138654), 国立大学法人東京大学 (東京都&#259... Read More


INTERNATIONAL PATENT: MITSUBISHI CHEMICAL CORPORATION, 三菱ケミカル株式会社 FILES APPLICATION FOR "MODIFIED NICOTINAMIDE PHOSPHORIBOSYLTRANSFERASE AND METHOD FOR PRODUCING NICOTINAMIDE MONONUCLEOTIDE USING SAME"

GENEVA, Oct. 5 -- MITSUBISHI CHEMICAL CORPORATION (1-1, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008251), 三菱ケミカル株式会社 (東&#20140... Read More


INTERNATIONAL PATENT: KOMATSU LTD., 株式会社小松製作所 FILES APPLICATION FOR "DISPLAY CONTROL DEVICE, INFORMATION TERMINAL, DISPLAY CONTROL METHOD AND DISPLAY CONTROL SYSTEM"

GENEVA, Oct. 5 -- KOMATSU LTD. (1-2-20, Kaigan, Minato-ku, Tokyo1058316), 株式会社小松製作所 (東京都港区海&#23... Read More


INTERNATIONAL PATENT: JSR CORPORATION, JSR株式会社 FILES APPLICATION FOR "METHOD FOR MANUFACTURING ELECTRONIC DEVICE AND ELECTRONIC DEVICE"

GENEVA, Oct. 5 -- JSR CORPORATION (9-2, Higashi-shimbashi 1-chome, Minato-ku, Tokyo1058640), JSR株式会社 (東京都港区東&... Read More


INTERNATIONAL PATENT: ZEON CORPORATION, 日本ゼオン株式会社 FILES APPLICATION FOR "ULTRAVIOLET-CURABLE COMPOSITION, CURED FILM AND ORGANIC EL DISPLAY DEVICE"

GENEVA, Oct. 5 -- ZEON CORPORATION (6-2, Marunouchi 1-chome, Chiyoda-ku, Tokyo1008246), 日本ゼオン株式会社 (東京都千&#2019... Read More


INTERNATIONAL PATENT: OMRON CORPORATION, オムロン株式会社 FILES APPLICATION FOR "ODOMETRY PARAMETER CALIBRATION DEVICE, METHOD AND PROGRAM"

GENEVA, Oct. 5 -- OMRON CORPORATION (801, Minamifudodo-cho, Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku, Kyoto-shi, Kyoto6008530), オムロン株式会社 (... Read More


INTERNATIONAL PATENT: TAMURA CORPORATION, 株式会社タムラ製作所, TOHOKU UNIVERSITY, 国立大学法人東北大学 FILES APPLICATION FOR "POWER SEMICONDUCTOR MODULE"

GENEVA, Oct. 5 -- TAMURA CORPORATION (1-19-43, Higashi-Oizumi, Nerima-ku, Tokyo1788511), 株式会社タムラ製作所 (東京都&#322... Read More


INTERNATIONAL PATENT: TOKYO ELECTRON LIMITED, 東京エレクトロン株式会社 FILES APPLICATION FOR "SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING SYSTEM"

GENEVA, Oct. 5 -- TOKYO ELECTRON LIMITED (3-1, Akasaka 5-chome, Minato-ku, Tokyo1076325), 東京エレクトロン株式会社 (東&#20... Read More