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INTERNATIONAL PATENT: TMEIC CORPORATION, 株式会社ＴＭＥＩＣ FILES APPLICATION FOR "CONTOUR DETECTION DEVICE AND SHAPE MEASUREMENT DEVICE"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- TMEIC CORPORATION (3-1-1, Kyobashi, Chuo-ku, Tokyo1040031), 株式会社ＴＭＥＩＣ (東京都中央&#21306... Read More

INTERNATIONAL PATENT: ARKEDGE SPACE INC., 株式会社アークエッジ・スペース FILES APPLICATION FOR "SIGNAL PROCESSING DEVICE, FLYING BODY, EARTH STATION, SIGNAL PROCESSING SYSTEM, METHOD AND PROGRAM"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- ARKEDGE SPACE INC. (3-33 Ariake 1-chome, Koto-ku, Tokyo1350063), 株式会社アークエッジ・スペー&#12... Read More

INTERNATIONAL PATENT: FANUC CORPORATION, ファナック株式会社 FILES APPLICATION FOR "CONTROL DEVICE AND PROGRAM"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- FANUC CORPORATION (3580, Shibokusa Aza-Komanba, Oshino-mura, Minamitsuru-gun, Yamanashi4010597), ファナック株式会社 (山&#... Read More

INTERNATIONAL PATENT: MITSUBISHI ELECTRIC BUILDING SOLUTIONS CORPORATION, 三菱電機ビルソリューションズ株式会社, MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "EXAMINATION ASSISTANCE DEVICE, EXAMINATION ASSISTANCE SYSTEM AND EXAMINATION ASSISTANCE METHOD"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- MITSUBISHI ELECTRIC BUILDING SOLUTIONS CORPORATION (7-1, Yurakucho 1-chome, Chiyoda-ku, Tokyo1000006), 三菱電機ビルソリュ&#1254... Read More

INTERNATIONAL PATENT: TOKYO ELECTRON LIMITED, 東京エレクトロン株式会社 FILES APPLICATION FOR "SUBSTRATE PROCESSING DEVICE AND SUBSTRATE PROCESSING METHOD"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- TOKYO ELECTRON LIMITED (3-1, Akasaka 5-chome, Minato-ku, Tokyo1076325), 東京エレクトロン株式会社 (東&#2... Read More

INTERNATIONAL PATENT: MITSUBISHI ELECTRIC CORPORATION, 三菱電機株式会社 FILES APPLICATION FOR "CONTROL APPARATUS, CONTROL METHOD AND CONTROL SYSTEM"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- MITSUBISHI ELECTRIC CORPORATION (7-3, Marunouchi 2-chome, Chiyoda-ku, Tokyo1008310), 三菱電機株式会社 (東京都&#2131... Read More

INTERNATIONAL PATENT: NEC CORPORATION, 日本電気株式会社 FILES APPLICATION FOR "IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, RECORDING MEDIUM, SELF-PROPELLED ROBOT AND ARTICLE MANAGEMENT SYSTEM"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- NEC CORPORATION (7-1, Shiba 5-chome, Minato-ku, Tokyo1088001), 日本電気株式会社 (東京都港区芝&#20... Read More

INTERNATIONAL PATENT: SONY SEMICONDUCTOR SOLUTIONS CORPORATION, ソニーセミコンダクタソリューションズ株式会社 FILES APPLICATION FOR "IMAGE SENSOR"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- SONY SEMICONDUCTOR SOLUTIONS CORPORATION (4-14-1 Asahi-cho, Atsugi-shi, Kanagawa2430014), ソニーセミコンダクタソ&#1... Read More

INTERNATIONAL PATENT: NGK INSULATORS, LTD., 日本碍子株式会社 FILES APPLICATION FOR "METHOD FOR PRODUCING BETA-ALUMINA SINTERED COMPACT"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- NGK INSULATORS, LTD. (2-56 Suda-cho, Mizuho-ku, Nagoya-shi, Aichi4678530), 日本碍子株式会社 (愛知県名古... Read More

INTERNATIONAL PATENT: HAKARI CORPORATION, 株式会社秤 FILES APPLICATION FOR "ANALYSIS PROGRAM, ANALYSIS SYSTEM, COMPUTER DEVICE AND ANALYSIS METHOD"

Posted On: 2025-11-10
Government News US Fed News

GENEVA, Nov. 10 -- HAKARI CORPORATION (Sagami Bld. 2F, 13-6, Ginza 7-chome, Chuo-ku, Tokyo1040061), 株式会社秤 (東京都中央区銀&#... Read More