ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,418, issued on June 17, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea) and UNIST (ULSAN NATIONAL INSTITUTE OF SCIENCE ... Read More
ALEXANDRIA, Va., June 19 -- United States Patent no. 12,336,368, issued on June 17, was assigned to Semiconductor Energy Laboratory Co. Ltd. (Japan). "Light-emitting device, light-emitting appliance,... Read More
ALEXANDRIA, Va., June 19 -- United States Patent no. 12,334,163, issued on June 17, was assigned to Micron Technology Inc. (Boise, Idaho). "Single-level cell program-verify, latch-limited data recove... Read More
ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,986, issued on June 17, was assigned to WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY Co. LTD. (Wuhan, China). "Display... Read More
ALEXANDRIA, Va., June 19 -- United States Patent no. 12,331,604, issued on June 17, was assigned to ARRIVAL ENERGY SOLUTIONS INC. (Leduc, Canada). "Indexing control system" was invented by Jayson Rus... Read More
ALEXANDRIA, Va., June 19 -- United States Patent no. 12,334,291, issued on June 17, was assigned to TOYOTA JIDOSHA K.K. (Toyota, Japan) and PACIFIC ENGINEERING CORP. (Ogaki, Japan). "Fuse" was invent... Read More
ALEXANDRIA, Va., June 19 -- United States Patent no. D1,079,674, issued on June 17. "Headset" was invented by Qibin Mai (Gaoyao, China). The patent was filed on Jan. 17, 2025, under Application No. ... Read More
ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,793, issued on June 17, was assigned to OSRAM GMBH (Munich). "Method for common detecting, tracking and classifying of objects" was invente... Read More
ALEXANDRIA, Va., June 19 -- United States Patent no. D1,079,673, issued on June 17. "Headset" was invented by Jianai Li (Hunan, China). The patent was filed on April 11, 2023, under Application No. ... Read More
ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,277, issued on June 17, was assigned to Tektronix Inc. (Beaverton, Ore.). "Thermal management system for a test-and-measurement probe" was ... Read More