ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,509,365, issued on Dec. 30, was assigned to Veolia Water Solutions & Technologies Support (Saint Maurice, France). "Simultaneous phase operated... Read More
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,509,654, issued on Dec. 30, was assigned to GLOBAL LIFE SCIENCES SOLUTIONS USA LLC (Marlborough, Mass.). "Bioprocessing system and consumable b... Read More
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,508,692, issued on Dec. 30, was assigned to GRIP HOLDINGS LLC (Brandon, Fla.). "Anti-slip torque tool" was invented by Paul Kukucka (Brandon, F... Read More
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,513,147, issued on Dec. 30, was assigned to Zscaler Inc. (San Jose, Calif.). "Systems and methods for dynamic distributed name resolution" was ... Read More
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,509,106, issued on Dec. 30. "Vehicle control apparatus and method thereof" was invented by Hyun Ju Kim (Yongin-Si, South Korea). According to ... Read More
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,513,752, issued on Dec. 30. "Two-step random access channel signaling" was invented by Xipeng Zhu (San Diego), Huichun Liu (San Diego), Ruiming... Read More
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,509,825, issued on Dec. 30, was assigned to AIKAWA FIBER TECHNOLOGIES OY (Helsinki). "Screen cylinder with bars configured to receive a wear re... Read More
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,513,090, issued on Dec. 30, was assigned to Dolby Laboratories Licensing Corp. (San Francisco). "Timestamp smoothing to remove jitter" was inve... Read More
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,334, issued on Dec. 30, was assigned to The United States of America as Represented by the Federal Bureau of Investigation, Department of Ju... Read More
ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,513,974, issued on Dec. 30, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Reduced silicon dislocation defects from deep SI trench integrati... Read More