US Patent Issued to International Business Machines on July 14 for "Configuring a fault-sensing ring oscillator circuit" (New York, Texas Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,075, issued on July 14, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Configuring a fault-sensing ring oscillator ... Read More

US Patent Issued to TEXAS INSTRUMENTS on July 14 for "High voltage integrated circuit testing interface assembly" (Taiwanese, American Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,076, issued on July 14, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "High voltage integrated circuit testing interface assembly" was i... Read More

US Patent Issued on July 14 for "Mass-interconnect engaging device" (Virginia Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,077, issued on July 14. "Mass-interconnect engaging device" was invented by Jeffery P. Stowers (Mt. Sidney, Va.) and Benjamin T. Ailinger (... Read More

US Patent Issued to TEXAS INSTRUMENTS on July 14 for "Procedure for making on-die-parametric measurements of circuit devices" (Texas Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,078, issued on July 14, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Procedure for making on-die-parametric measurements of circuit de... Read More

US Patent Issued on July 14 for "Planarity control for load pull tuner on wafer" (Canadian Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,079, issued on July 14. "Planarity control for load pull tuner on wafer" was invented by Christos Tsironis (Kirkland, Canada). According t... Read More

US Patent Issued to BATTELLE MEMORIAL INSTITUTE on July 14 for "System and method for rapid inspection of printed circuit board using multiple modalities" (Ohio Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,080, issued on July 14, was assigned to BATTELLE MEMORIAL INSTITUTE (Columbus, Ohio). "System and method for rapid inspection of printed ci... Read More

US Patent Issued to SAMSUNG ELECTRONICS on July 14 for "Jitter measuring circuit, jitter analyzing apparatus including the same, and related methods of manufacturing semiconductor devices" (South Korean Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,081, issued on July 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Jitter measuring circuit, jitter analyzing a... Read More

US Patent Issued to Infineon Technologies on July 14 for "Electronic device" (German, Austrian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,082, issued on July 14, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Electronic device" was invented by Wei Wang (Munich... Read More

US Patent Issued to Marvell Asia on July 14 for "System and method for schedule-based I/O multiplexing for integrated circuit (IC) scan test" (California Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,084, issued on July 14, was assigned to Marvell Asia Pte Ltd (Singapore). "System and method for schedule-based I/O multiplexing for integr... Read More

US Patent Issued to Intel on July 14 for "Infield periodic device testing while maintaining host connectivity" (American, Indian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,085, issued on July 14, was assigned to Intel Corp. (Santa Clara, Calif.). "Infield periodic device testing while maintaining host connecti... Read More

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