ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,075, issued on July 14, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Configuring a fault-sensing ring oscillator ... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,076, issued on July 14, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "High voltage integrated circuit testing interface assembly" was i... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,077, issued on July 14. "Mass-interconnect engaging device" was invented by Jeffery P. Stowers (Mt. Sidney, Va.) and Benjamin T. Ailinger (... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,078, issued on July 14, was assigned to TEXAS INSTRUMENTS Inc. (Dallas). "Procedure for making on-die-parametric measurements of circuit de... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,079, issued on July 14. "Planarity control for load pull tuner on wafer" was invented by Christos Tsironis (Kirkland, Canada). According t... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,080, issued on July 14, was assigned to BATTELLE MEMORIAL INSTITUTE (Columbus, Ohio). "System and method for rapid inspection of printed ci... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,081, issued on July 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Jitter measuring circuit, jitter analyzing a... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,082, issued on July 14, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Electronic device" was invented by Wei Wang (Munich... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,084, issued on July 14, was assigned to Marvell Asia Pte Ltd (Singapore). "System and method for schedule-based I/O multiplexing for integr... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,085, issued on July 14, was assigned to Intel Corp. (Santa Clara, Calif.). "Infield periodic device testing while maintaining host connecti... Read More