US Patent Issued to Taiwan Semiconductor Manufacturing on June 30 for "Three-dimensional one time programmable memory" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,959, issued on June 30, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Three-dimensional one time programm... और पढ़ें

US Patent Issued to MACRONIX International on June 30 for "Memory device for applying voltages to word lines during erase operations and operating method for memory device" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,960, issued on June 30, was assigned to MACRONIX International Co. Ltd. (Hsinchu, Taiwan). "Memory device for applying voltages to word lin... और पढ़ें

US Patent Issued to Micron Technology on June 30 for "NAND detect empty page scan using subsets of wordlines on a page" (California Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,961, issued on June 30, was assigned to Micron Technology Inc. (Boise, Idaho). "NAND detect empty page scan using subsets of wordlines on a... और पढ़ें

US Patent Issued to Sandisk Technologies on June 30 for "Analog bitscan techniques in a memory device" (California Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,962, issued on June 30, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Analog bitscan techniques in a memory device" was in... और पढ़ें

US Patent Issued to Sandisk Technologies on June 30 for "Single-level memory cell error on-chip detection" (California Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,963, issued on June 30, was assigned to Sandisk Technologies Inc (Milpitas, Calif.). "Single-level memory cell error on-chip detection" was... और पढ़ें

US Patent Issued to SK hynix on June 30 for "Apparatus and method for changing a read voltage applied for reading data from a non-volatile memory cell" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,964, issued on June 30, was assigned to SK hynix Inc. (Gyeonggi-do, South Korea). "Apparatus and method for changing a read voltage applied... और पढ़ें

US Patent Issued to UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY on June 30 for "Non-linear memory failure analysis method and memory test apparatus" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,965, issued on June 30, was assigned to UIF (UNIVERSITY INDUSTRY FOUNDATION), YONSEI UNIVERSITY (Seoul, South Korea). "Non-linear memory fa... और पढ़ें

US Patent Issued to Micron Technology on June 30 for "Device data path monitor" (California Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,966, issued on June 30, was assigned to Micron Technology Inc. (Boise, Idaho). "Device data path monitor" was invented by Leon Zlotnik (Cam... और पढ़ें

US Patent Issued to Micron Technology on June 30 for "Apparatuses and methods for testing memory devices" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,967, issued on June 30, was assigned to Micron Technology Inc. (Boise, Idaho). "Apparatuses and methods for testing memory devices" was inv... और पढ़ें

US Patent Issued to Winbound Electronics on June 30 for "Method and apparatus for memory testing" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,968, issued on June 30, was assigned to Winbound Electronics Corp. (Taichung City, Taiwan). "Method and apparatus for memory testing" was i... और पढ़ें

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