US Patent Issued to YC on Nov. 4 for "Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,142, issued on Nov. 4, was assigned to YC Corp. (Gyeonggi-do, South Korea).

"Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus" was invented by Yong Hyun Kim (Seoul, South Korea), Jae Hoon Joo (Yongin-si, South Korea), Hyo Sang Jo (Uiwang-si, South Korea) and Ki Young Jeon (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor wafer test system for controlling the supply of power to a semiconductor wafer test apparatus is provided. The semiconductor wafer test system includes a test operat...