US Patent Issued to Siemens Healthineers on Feb. 24 for "EPI data correction method and device and MRI system" (German, Chinese Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,666, issued on Feb. 24, was assigned to Siemens Healthineers AG (Forchheim, Germany).

"EPI data correction method and device and MRI system" was invented by Wei Liu (Erlangen, Germany), Kun Zhou (Shenzhen, China), Nan Xiao (Shenzhen, China), Simon Bauer (Baunach, Germany) and Adam Kettinger (Erlangen, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques are provided for performing echo planar imaging (EPI) data correction. This includes obtaining positive and negative readout gradient calibration data of an imaging target through non-accelerated EPI acquisitions; respectively adopting first and second DPG kernels to be fitted and respec...